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MikroskopPrzeglądSEIKO Precision Inc. in Japan has devloped a series of high resolution and wide area imaging microscopes that can provide microscope scans in highest resolution and speed. Current applications include the fully automatic detection and analysis of CR-39 probe detectors as well as radiology badges. The software and system components have been developed in a close partnership with the National Institute of Radiological Sciences (an Independent Administrative Institution) in Japan. |
